ESCA, XPS, XP, electron, X-ray, photoelectron, data, spectra, spectrum, database, software, processing, reduction, spectroscopy, peak fit fitting, curve fit fitting, FWHM, peak width, signal width, band width, binding, chemical, analysis, characterization, analytical, material, resolution, charge, control, state, synchrotron, oxide, silicon, aluminum, semiconductor, science, chemical, damage, element, metal, polymer, alloy, ceramic, mineral, nitride, sulfide, halide, hydroxide
   
  Organized by expected level of interest, need and key word usage


1. ESCA,
2. XPS,
3. XP,
4. electron,
5. X-ray,
6. photoelectron,
7. data,
8. spectrum,
     spectra
9. database,
10. software,
11. processing,
12. reduction,
13. spectroscopy,
14. peak fit fitting,
15. curve fit fitting,
16. FWHM,
17. peak width,
      signal width
      band width
18. binding,
19. chemical,
20. analysis,
21. characterization,
22. surface,
23. material,
24. resolution,
25. charge,
26. science,
27. state,
28. synchrotron,
29. oxide,
30. semiconductor,

31. aluminum,
32. science,
33. element,
34. metal,
35. polymer,
36. alloy,
37. ceramic,
38. mineral,
39. nitride,
40. sulfide,
41. hydroxide,