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|5 VOLUME SERIES of XPS SPECTRAL HANDBOOKS|
Monochromatic XPS Spectra - 5 Volume Series
(2,200 spectra in 5 hard cover / loose-leaf binders, landscape layout, 3 copies permitted).
Each handbook is self-contained and includes comprehensive information about the instrument and the methods used to collect the spectra. The spectra are presented one spectrum per page in landscape format in loose-leaf, hard cover binders. All spectra are from the self-consistent XI Library of Monochromatic XPS Spectra (US Reg. Copyright © # TX 4-560-881).
Energy resolution settings, instrument characteristics, energy referencing methods, traceability, energy scale calibration details, and transmission function are all reported. The XPS signals in the wide scan survey spectra are fully annotated and are accompanied by detailed atom % tables that report BEs for each of the labeled peaks.
The XPS signals in the high energy resolution spectra are peak-fitted. Binding Energies (BEs), FWHMs and relative signal percentages are printed on each high energy resolution spectrum. Survey scans are fully labeled. The first page of each spectra-set provides a chemical formula at the top right, a CAS number, original file-name, sample description, special details about sample handling, sample preparation, ion etching if done, charge control methods used, the date of the analysis and then a detailed table of of the results from processing the survey spectrum. The table provides signal label, corrected BE, experimental BE, corrected RSF, normalized peak area, relative peak area and atom % values. The total number of pages in the complete set of handbooks is more than 2,500.
Each handbook includes a 20 page introductory section which discusses:
· Instrument Details Experimental Details · Data Processing Details · Sample Details □ Source of Elements and Chemical Compounds □ Source of Polymer Materials □ Source of Alloys Source of Semi-Conductor Materials □ Source of Commercially Pure Binary Oxides □ Powdered Samples Pressed into 3 mm Diameter Pellets □ Benefits of Pressing Powders into Pellets □ Problems Caused by Pressing Samples into Pellets □ Solution to Pressure Induced Contamination of Pellets □ Source of Pellet Press Equipment · Energy Resolution Details · Energy Scale Reference Energies and Calibration Detail □ Reference Energies of Adventitious Hydrocarbon Contaminants □ Instrument Stability and Long Term Energy Scale Calibration · Electron Counting, Instrument Response and Atom% Details □ Instrument Response Function □ Signal / Background Ratios for Ion Etched Silver (Ag) □ Effects of Poorly Focusing the Distance between the Sample and the Electron Lens □ Atom % Composition Details and Choice of "Sensitivity Exponent" □ Crude Tests of the Reliability of Relative Sensitivity Factors · Traceability Details □ Traceability of Reference Binding Energies (Calibration) □ Traceability Transfer from Pure Metals to Non-Conductive Binary Oxides □ Traceability of Relative Sensitivity Factors used for Atom% Calculations □ Traceability of Sample Purity · Reference Papers Describing the X-Probe, M-Probe, and S-Probe XPS Systems
Five (5) volumes are currently available:
Includes wide scan spectra and high energy resolution spectra for the elements Ag, Al, Ar(+), As, Au, B, Ba(+), Be, Bi, Br (-), C, Ca (2+), Cd, Ce (4+), Cl (-), Co, Cr, Cs (+), Cu, Dy, Er, Eu, F (-), Fe, Ga, Gd, Ge, Hf, Hg, Ho, I (-), In, Ir, K (+), La (3+), Li (+), Lu, Mg, Mn, Mo, N (3-), Na (+), Nb, Nd, Ni, O (2-), P, Pb, Pd, Pr, Pt, Rb (+), Re, Rh, Ru, S, Sb, Sc, Se, Si, Sm, Sn, Sr (2+), Ta, Tb, Te, Ti, Tl, Tm. V, W, Xe (+), Y, Yb, Zn, and Zr. All surfaces were cleaned by using practical methods. All high energy resolution spectra are peak-fitted to reveal FWHM, and peak separation for spin-orbit pairs. The strong signals observed in the wide scan spectra are labeled and tabulated together with rough BE values of those strong signals. The BEs of the high energy resolution spectra in this handbook were used as part of a recent NIST study to determine "reliable" binding energies of the principal XPS signals of each element (C.J.Powell, Applied Surface Science, Vol. 89, pp 141-149, 1995.) The standard deviation for BEs from the XI Library of Monochromatic XPS Spectra was <0.06.
The Native Oxides:
Includes wide scan spectra, and principal signal high energy resolution spectra, C 1s high energy resolution spectra, and O 1s high energy resolution spectra found, as received, in/on the naturally formed, native oxides of the elements Ag, Al, As, B, Be, Bi, Cd, Co, Cu, Fe, Ga, Ge, Hf, In, Ir, Mg, Mn, Mo, Nb, Ni, Pb, Pd, Pt, Re, Rh, Ru, Sb, Sc, Se, Sn, Ta, Te, Ti, Tl, V, W, Y, Zn, and Zr. Atomic percentage tables of surface composition are provided. These spectra reveal the natural oxidative tendencies of the elements and the tendencies of these elements to capture various gases from the air and/or various contaminants introduced to the surface from handling by the original chemical producers. No attempt was made to clean these samples.
Includes wide scan spectra, principal metal signal high energy resolution spectra, some secondary metal signal high energy resolution spectra, C 1s high energy resolution spectra, O 1s high energy resolution spectra, valence band spectra, some Auger signal spectra, and atom % data obtained from the following as-received commercially produced binary oxides, AgO, Ag2O, Al2O3, As2O3, Au2O3, B2O3, BeO, Bi2O3, CaO, CdO, CoO, Co3O4, CrO3, Cr2O3, Cu2O, CuO, FeO, a-Fe2O3, γ-Fe2O3, Fe3O4, Ga2O3, GeO2, HfO2, HgO, In2O3, IrO2, MgO, MnO, Mn2O3, MoO3, Nb2O5, NiO, PbO, PbO2, PdO, PtO2-nH2O, Re2O7, Rh2O3, RuO2, Sb2O3, Sb2O5, Sc2O3, SiO, SiO2, SnO, SnO2, Ta2O5, TiO, Ti2O3, Tl2O3, VO2, V2O3, V2O5, WO3, Y2O3, ZnO, and ZrO2.
Includes wide scan spectra, principal metal signal high energy resolution spectra, some secondary metal signal high energy resolution spectra, C 1s high energy resolution spectra, O 1s high energy resolution spectra, valence band spectra, Auger signal spectra, and atom % data obtained from the following semiconductors that were analyzed "as received" and "after freshly exposing the bulk" by fracturing in air. Some materials were analyzed "after ion etching" or "chemical cleaning". Semiconductors analyzed include: AlGaAs, AlN, BeO, BN, C, CdO, CdSe, Cu2O, CuCl, Diamond, GaAs, GaInAs, GaP (100), GaP (111), GaSb, GeSe, GeSe2, HgS, HgTe, HOPG, InP, InSb, InSnOx (ITO), n-Si, p-Si, un-doped Si, NBS p-Si, NiO, Pb2O3, PbO2, PbO, PbS, SbTe, Se, Si3N4, SnO2, Te, WO3, ZnO.
Includes wide scan spectra, high energy resolution C 1s high energy resolution spectra, O 1sspectra, other principal signal high energy resolution spectra, and atom % data tables from polymers known as: poly-ethylene (PE), poly-vinyl chloride (PVC), poly-vinylidene di-fluoride (PVDF), poly-tetrafluoroethylene (PTFE), poly-styrene (PS), poly-a-methyl styrene (AMPS), poly-4-methyl styrene (4MPS), poly-4-octylstyrene (POS), poly-4-hydroxystyrene (PHS), poly-4-hydroxystyrene-derviatized with trifluoro acetic anhydride, poly-4-ethoxystyrene (PES), poly-4,4-dimethoxy benzophenone (4DBP), poly-ether ether ketone (PEEK), poly-ethylene terephthalate (PET), poly-ethyl acrylate (PEA), poly-methyl acrylate (PMA), poly-methyl methacrylate (PMMA) on copper, poly-ethyl methacrylate (EMA), poly-2-hydroxyl methacrylate (HEMA), poly-trimethyl silane hydroxyethyl methacrylate (CLMA), poly-ethylene glycol (PEG), poly-propylene glycol (PPG), poly-tetramethylene glycol (PTMG), poly-vinyl alcohol (PVA), Biomer™, poly-methylene di-isocynate/propane-diamine copolymer (MDPD), poly-methylene diisocynate/butane-diol copolymer (MDBD), poly-methylene diisocynate/propane-diamine/butane-diol terpolymer (MDBP), poly-dimethyl siloxane (PDMS) and Whatman™ filter paper (cellulose). This data set was obtained by the ESCA research group at the National ECSA Center for Surface Analysis of Bio-Materials located at the University of Washington, Washington, USA.
Polymers Degraded by Long Term (12-14 hr) Exposure to Monochromatic X-rays:
Includes wide scan spectra, and >15 repetitive cycles of high energy resolution C 1s high energy resolution spectra, O 1s spectra, other principal signal high energy resolution spectra, and atom % data tables from polymers known as: poly-acetal, poly-acrylonitrile (PAN), poly-amide, poly-1-butene, poly-caprolactam (nylon 6), poly-carbonate bis-phenol A (PC), poly-ethylene (HDPE), poly-ethylene oxide (PEO), poly-ethylene terephthalate (PET), poly-imide (Kapton), poly-methylmethacrylate (PMMA), poly-4-methyl-1-pentene, poly-phenylene sulfide (PPS), poly-propylene (PP), poly-styrene (PS), poly-sulfone resin, poly-tetrafluoroethylene (PTFE), poly-vinyl acetate (PVA), poly-vinyl chloride (PVC), poly-vinylidene fluoride, and nitrocellulose. Each sample was analyzed overnight for >12 hours to observe the X-ray induced changes that occur from extended exposure to X-rays. Overlays of the initial and final state spectra, which reveal the degree and nature of the degradation caused by the long term exposure, are included. At the end is a section showing step-wise degradation of various polymers that occurred during overnight runs. These plots reveal progressive changes in the chemical state structure of various polymers.
A collection of other polymers, which have not been studied for damage, is also included in this section.
Volume 5 - Rare Earth Oxides, Hydroxides, Carbonates, Nitrides, Sulfides, Acetates, Carbides, Borides & Misc. (551 pages)
Sample Pages of Vol. 5
(fully annotated PDF version in progress )
Includes wide scan spectra, principal metal signal high energy resolution spectra, some secondary metal signal high energy resolution spectra, C 1s high energy resolution spectra, O 1s high energy resolution spectra, valence band spectra, Auger signal spectra, and atom % data tables obtained from CeO2, Dy2O3, Er2O3, Eu2O3, Gd2O3, Ho2O3, Lu2O3, Pr2O5, Sm2O3, Tb3O7, Tm2O3, Yb2O3, Al(OH)3, Cd(OH)x, Co(OH)2, Cu(OH)2, FeOOH, LiOH, Mg(OH)2, Ni(OH)2, (BiO)2CO3, CaCO3, CaCO3 (Calcite), CdCO3, CuCO3, CuCO3-Cu(OH)2 (Azurite), Li2CO3, MgCO3, MgCO3 (Magnesite), MnCO3 (Rhodochrosite), PbCO3 (Cerrusite), SrCO3, Y2CO3, Y2CO3-LaB6, AlN, BN, CrN, Si3N4, TiN, Ag2S (Argentite), As2S2 (Realgar), As2S3 (Orpiment), CuS (Covellite), FeS2 (Pyrite), HgS (Cinnabar), MoS2 (natural), PbS (Galena), TaS2, ZnS, BaOAc. RbOAc, NbC, TaC, VC, Ni3B, WB, Cleaning solution, Heat treated copper foil, Copper Pthalocyanine, Double sided adhesive tape (3M™), Jewelry, Loctite™ #493, Loctite™ #414, Mold release agent, Silicone remover agent, Tin plated wire, Black Widow spider web. Borosilicate glass, Pyrex™ glass, and Soda-lime glass.
Each handbook is complete, self contained, and includes comprehensive notes on the instruments and instrumental conditions used in recording the spectra as well as details of experimental procedures. Transmission functions, resolution settings and characteristics, energy reference considerations, traceability and calibration details are all covered. The spectra contain many peak fits and fully annotated wide scans with tabulated numerical quantitative summaries.
A set of spectra for a particular chemical is located by looking for the chemical formula abbreviation written in the upper right hand corner of each page. For the binary oxide known as "aluminum oxide" the user should look for the chemical abbreviation "Al2O3" in the upper right corner of the pages that belong to that set of data and spectra. In the case of "Antimony Oxide" the spectra will be found by looking for the chemical formula: "Sb2O3".
|XPS HANDBOOKS - Hard Cover, A4 Landscape Format, Loose-Leaf Binders, Paper (3 copies allowed)|
|Complete Set - All 5 Volumes||Volumes 1-5||>2,500 pages|
|The Elements & Native Oxides||Vol. 1||546 pages|
|Commercially Pure Binary Oxides||Vol. 2||480 pages|
|Semiconductors||Vol. 3||565 pages|
|Polymers and Polymers Damaged by X-rays||Vol. 4||454 pages|
|Rare Earth Oxides, Hydroxides, Carbonates...||Vol. 5||551 pages|
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